Alignment measuring system and method
US4914964A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Aug 4, 1988 |
| Grant date | Apr 10, 1990 |
| Priority date | — |
| Expiry date | Aug 4, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01G11/006
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus for measuring the alignment of two or more adjacent targets while the targets are in motion is provided. The alignment measuring apparatus includes a plurality of alignment scanners, each adapted to detecting the arrival of an associated target. A speed scanner is spaced apart from the alignment scanner for detecting said first one of the targets. First timing means are provided for measuring a first time differential indicative of the time delay between detection of the leading and trailing targets by the alignment scanners to provide a measurement proportional to the misalignment between the targets. Second timing means measure a second time differential indicative of the time delay between detection of the first target by the speed scanner and its associated alignment scanner to provide a measurement that is proportional to the speed at which the lugs are traveling and determining whether adjacent lugs are within a selected alignment tolerance based in part upon the time differential measurements. An oscillatory timing clock operates at a selected frequency and the first timing means determines the number of clock pulses that occur during said first time differentia…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.