Optical device using a matched interferometric analyzer and filter
US4915499A · kind A · utility
9Cited by
6References
7Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jan 12, 1988 |
| Grant date | Apr 10, 1990 |
| Priority date | — |
| Expiry date | Jan 12, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01P3/36
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The device according to the invention comprises a wide spectrum lighting source (60), a first interferometer (FP1) serving as a filter, a second interferometer (FP2) with the same characteristics as the first and a photodetector (66). The identity of the characteristics of the two interferometers makes it possible to work with higher lighting power levels than in the prior art. The two interferometers are advantageously constituted by a single apparatus used twice. Application to the measurement of the position, displacement or speed of a surface, particularly in detonics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.