Patent · US Expired

Monolithic integrated planar semiconductor system and process for making the same

US4916494A · kind A · utility

11Cited by
2References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 6, 1987
Grant dateApr 10, 1990
Priority date
Expiry dateOct 6, 2007

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D64/111

Abstract

A monolithic integrated semiconductor device is described, wherein for the adjustment of the breakdown voltage a cover electrode (7) is disposed in the area of the pn-junctions and a corresponding potential is applied through a voltage divider (1) for adjusting the breakdown voltage. For maintaining a temperature independent breakdown voltage it is provided that the voltage divider (1) consists of resistors (R1, R2) in the form of diffused zones which have different doping levels. The resulting different temperature coefficients of the resistors (R1,R2) of the voltage divider cause a temperature dependent potential change of the cover electrode potential, whereby a temperature stabilization of the breakdown voltage is obtained.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.