Adjustable low inductance probe
US4923407A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 2, 1989 |
| Grant date | May 8, 1990 |
| Priority date | — |
| Expiry date | Oct 2, 2009 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01R11/18
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A low inductance probe contains a signal probe shaft having a signal probe point and an adjacent ground conductor or conductive shield for placing on the circuit location which is desired to be measured, a ground probe arm having a ground probe point for placing on a convenient ground location. The ground probe arm is attached to the signal probe shaft by means of a hinge which enable the ground probe arm to rotate between zero and approximately 135 degrees in a compass like fashion. The ground conductor of the signal probe shaft and the ground probe point of the ground probe arm are electrically connected by means of a low inductance ground lead consisting of a monolithic, flexible strand of conductive foil.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.