Scanning ion conductance microscope
US4924091A · kind A · utility
72Cited by
1References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 1, 1989 |
| Grant date | May 8, 1990 |
| Priority date | — |
| Expiry date | Feb 1, 2009 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/86
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scanning ion conductance microscope, SICM, which can image the topography of soft non-conducting surfaces covered with electrolytes by maintaining a micropipette probe at a constant conductance distance from the surface. It can also sample and image the local ion currents above the surfaces by scanning the micropipette probe in a plane located at a constant distance above the surface. Multiple micropipettes mounted in a multi-barrel head and containing various ion specific electrodes allow simultaneous scanning for different ion currents.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.