Patent · US Expired

Semiconductor wafer and epitaxial growth on the semiconductor wafer with autodoping control and manufacturing method therefor

US4925809A · kind A · utility

38Cited by
13References
6Claims
0Family size

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Key dates

Filing dateJul 1, 1988
Grant dateMay 15, 1990
Priority date
Expiry dateJul 1, 2008

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/959
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A semiconductor wafer on which silicon or the like is epitaxially grown and p-type or n-type impurities are doped and which has at the rear surface except for the peripheral edge portion thereof a blocking film for preventing jumping out of impurities therefrom which causes auto-doping, thereby preventing silicon particles from being produced at the peripheral surface and preventing the semiconductor wafer from being contaminated by the silicon particles during the manufacturing of a semiconductor device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.