Apparatus and method for optical measuring and imaging of electrical potentials
US4926043A · kind A · utility
2Cited by
6References
17Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Feb 11, 1988 |
| Grant date | May 15, 1990 |
| Priority date | — |
| Expiry date | Feb 11, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/95638
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An apparatus and method include using an electro-optic crystal lying on a component surface, the crystal being coated with a cooperating electrode which is transparent to a sampling laser beam to optically measure and image electrical potentials and voltage levels independently of topographical influences.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.