Multiplication measurement of ion mass spectra
US4931639A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Sep 8, 1988 |
| Grant date | Jun 5, 1990 |
| Priority date | — |
| Expiry date | Sep 8, 2008 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10T436/24
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method for increasing the signal to noise and/or the speed of data collection for obtaining a collective secondary ion spectrum from selected combinations of primary ions is disclosed. The multiplicative capability of dissociating any combination of parent ions to form the collective secondary ion spectrum different combinations, each incorporating approximately 1/2 of the parent ions in a sample are measured in each cycle of measurement, and n collective spectra are obtained for n parent ions. The individual contributions at each specific mass in each secondary ion spectrum are calculated from the n simultaneous equations representing the summed intensity values at each mass.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.