Method and apparatus for active vision image enhancement with wavelength matching
US4933541A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jun 29, 1989 |
| Grant date | Jun 12, 1990 |
| Priority date | — |
| Expiry date | Jun 29, 2009 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB23K9/127
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for optically inspecting the geometry of a surface in an environment which is subject to the presence of external light noise perturbations. A beam of monochromatic light having a predetermined wavelength and a structured light pattern is projected onto the surface to thereby scatter the structured light beam and produce a scattered light beam which is thereafter separated into first and second scattered beam portions. The first scattered beam portion is passed through a first optical filter having a narrow bandwidth and a central wavelength corresponding substantially to the wavelength of the projected light, thereby providing a first optical output signal representative of the surface geometry and of external light noise perturbation. The second scattered beam portion is passed through a second optical filter having a narrow wavelength bandwidth and a central wavelength which is closely spaced from the predetermined wavelength of the projected light by a wavelength offset such as to reject the projected light wavelength, thereby providing a second optical output signal representative of substantially the same external light noise perturbation as that passin…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.