Patent · US Expired

Manufacturing method for a ceramic capacitor

US4937096A · kind A · utility

20Cited by
6References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 25, 1988
Grant dateJun 26, 1990
Priority date
Expiry dateJul 25, 2008

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01G2/20
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A manufacturing method for a ceramic capacitor superior in breakdown voltage ability, comprising a process of baking opposite electrode on the surface of ceramic dielectric composed mainly of metal oxide and that, simultaneous with or after the above process, of baking in a ring-like shape insulating layers for air cutoff on at least the edges of an electrode. The opposite electrodes are formed by baking on the ceramic dielectric an electrode material composed mainly of metal of oxidization property more intense than that of the metal oxide at the ceramic dielectric material, in which, when the insulating layers on the electrode are baked, parts covered with the insulating layers at the opposite electrodes are cutoff from air, so that the ceramic dielectrics just below the parts are deprived by the opposite electrodes of inner oxygen so as to be intensively reduced and the reduced areas each become a semiconductor to largely decrease an insulating resistance value, thereby relaxing a potential gradient at the edge of the electrode and improving the breakdown voltage ability.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.