Patent · US Expired

Method and apparatus for estimating fault coverage

US4937765A · kind A · utility

45Cited by
13References
14Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 29, 1988
Grant dateJun 26, 1990
Priority date
Expiry dateJul 29, 2008

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31835
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Method and apparatus estimates fault coverage of a set of test vectors to be applied to a circuit containing sequential elements. The apparatus permits sequential elements to be represented as functional blocks rather than combinational circuits with feedback. This is accomplished by taking into account the external state of the sequential element during circuit simulation. The apparatus also takes into account high impedance as possible inputs and outputs.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.