Sensor with integrated signal processing for one- to three-dimensional positioning
US4938589A · kind A · utility
5Cited by
13References
15Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Jan 20, 1988 |
| Grant date | Jul 3, 1990 |
| Priority date | — |
| Expiry date | Jan 20, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C3/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The sensor comprises a radiation source (2), optical elements (5), a pattern generator (4), and a sensor field (3) which includes a plurality of distinguishable, measurable points. The pattern generator (4) changes the beam reflected from an object (8), imaging a pattern on the sensor field (3). An evaluator means (6) samples the individual distinguishable, measurable points of the sensor field and determines the measurement variable on that basis.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.