Polychromatic optical strain gauge
US4939368A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Apr 13, 1989 |
| Grant date | Jul 3, 1990 |
| Priority date | — |
| Expiry date | Apr 13, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/165
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and apparatus for measuring strain of an object is provided. The object to be measured is provided with a diffraction grating which is illuminated with radiation including at least two frequencies to produce an interference pattern. At least a portion of the interference pattern corresponding to at least one of the frequencies is detected and analyzed to determine strain. In some embodiments, the frequency of a portion of the diffraction pattern is detected, for example, by a human eye and the detected frequency compared with known frequencies to determine strain. In other embodiments, the relative angular position of portions of the pattern corresponding to different frequencies is detected. Since the relative angular position and intensity is affected by strain but not by certain rigid body rotations, strain measurement free of body rotation error may be made.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.