Method and device for measuring characteristic magnetic distribution of a magnetic thin film using a magnetic head
US4940938A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 2, 1988 |
| Grant date | Jul 10, 1990 |
| Priority date | — |
| Expiry date | Mar 2, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Primary and secondary coils are wound on a differential type magnetic head, and a low frequency signal is applied on the primary coil. Based on the difference between the output voltages from the head when an object of detection is placed near the magnetic head on the detection side and the output voltage therefrom when an object is not placed near the magnetic head, the magnetization characteristic curve of the magnetic flux and the magnetic field is calculated. Since the magnetization characteristic detection is determined by dividing a magnetic flux by the measured area cross section, once the magnetic flux is determined, a general B-H curve can be simply calculated. The magnetization characteristic measurement device includes a differential type magnetic head portion having plural differential type magnetic heads in linear arrangement which is positioned on or near the magnetic thin film of a detection object. The device can calculate magnetization characteristics of the magnetic thin film by applying a low frequency signal on the magnetic head, successively switching differential output voltages given to a cancellation core of the plural differential magnetic cores by a data c…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.