Two parameter clutter map
US4940988A · kind A · utility
10Cited by
22References
23Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 2, 1988 |
| Grant date | Jul 10, 1990 |
| Priority date | — |
| Expiry date | Nov 2, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S13/5248
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A two-parameter clutter map for storing two variables for every spatial location in order to define both the intensity of the interference and the fluctuation characteristics of the interference from scan-to-scan. The two variables are obtained by processing input data from an integrator in two n-pole integrators having different orders. The ratio of the two variables or their difference in logarithmic form is employed as a measure of the scan-to-scan fluctuation characteristics. An option to control alarms and the leading edge of moving rain storms is also provided.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.