Method and apparatus for defect detection and location
US4943732A · kind A · utility
11Cited by
2References
22Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Aug 16, 1989 |
| Grant date | Jul 24, 1990 |
| Priority date | — |
| Expiry date | Aug 16, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/103
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods and apparatus for locating defects in liquid crystal display (LCD) panels include scanning the panel with a laser, detecting reflected, refracted, scattered or transmitted light, and processing signals representative of the detected light utilizing a digital processor, to detect discontinuities in the arrays of LCD elements on the panel.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.