Method of reducing the susceptibility to interference of a measuring instrument
US4944589A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Sep 22, 1988 |
| Grant date | Jul 31, 1990 |
| Priority date | — |
| Expiry date | Sep 22, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J3/28
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of reducing the susceptibility to interference of the measured value from a measuring instrument. The measuring instrument is of such a type where a test object is subjected to measurements with respect to a plurality of primary test object properties. Before the actual measurement, the effect has been mapped, by a calibration procedure, which these properties have on the measured value regarding a secondary property of the test object. The calibration procedure is effected on the one hand in that measurements by means of the same or similar instruments are carried out on a sufficient number of test objects each having a known value of the secondary property, and with a sufficient variation of the other test object properties affecting the secondary property, so as to cover expected variations of said properties, and, on the other hand, in that the thus obtained measured values of the primary properties are processed mathematically in such manner that a number of calibration constants in a mathematical relationship between the primary properties and the secondary property are generated. During the calibration procedure, a variation of one or several properties of the measu…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.