Temperature compensation in differential pressure leak detection
US4947352A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Mar 25, 1988 |
| Grant date | Aug 7, 1990 |
| Priority date | — |
| Expiry date | Mar 25, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M3/26
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A microprocessor is employed to control a test program which operates to cause a component under test to be filled (or evacuated) to a predetermined pressure P.sub.2 at which a leak test is to be carried out. The test program is arranged firstly to perform a rapid test at atmospheric pressure P.sub.1 to determine the pressure change dpl'/dt in the component due to the temperature fluctuation. The component is then filled (or evacuated) automatically to the test pressure P.sub.T, at which the leak check is carried out. Temperature compensation is achieved by subtracting the value of C dpl'/dt from the pressure change dp.sub.t /dt actually measured, i.e. the actual leak rate dPL/dt is given by ##EQU1## where the constant, C, is generated from an identical proram run, the calibration run, on a known non-leaker with a high temperature fluctuation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.