Plasma ion source mass spectrometer
US4948962A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 6, 1989 |
| Grant date | Aug 14, 1990 |
| Priority date | — |
| Expiry date | Jun 6, 2009 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/12
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
Disclosed is a plasma ion source mass spectrometer comprising an ion source in which a sample to be detected is ionized in plasma and a mass spectrometer which mass-separates and detects the ionized sample supplied from the ion source, characterized in that there is provided a gas introduction means for introducing into a region before the mass spectrometer a gas containing particles which can bring about a charge transfer reaction with background ions contained in particles supplied from the ion source or a gas containing particles which can bring about an energy transfer reaction with excited molecule contained in the particles supplied from the ion source. By providing such gas introduction means, background ions or excited molecule can be efficiently quenched and enhancement of sensitivity of plasma ion source mass spectrometer can be attained.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.