X-ray spectrometer having a doubly curved crystal
US4949367A · kind A · utility
25Cited by
8References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 29, 1989 |
| Grant date | Aug 14, 1990 |
| Priority date | — |
| Expiry date | Mar 29, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K2201/064
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray analysis crystal is also curved in a direction transverse to the dispersion direction to increase the radiation efficiency. As a result of this radiation diffracted at the crystal is focused towards a detector input. In order to ensure a non-deformable crystal surface the crystal is preferably bonded to a carrier having an adapted bonding profile.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.