Process and apparatus for measuring the roughness of the surface of a piece
US4951497A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 17, 1989 |
| Grant date | Aug 28, 1990 |
| Priority date | — |
| Expiry date | Jan 17, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B7/34
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This invention relates to a process for measuring the roughness of a surface of a piece in which there is applied on the rough surface of the piece a first surface of a deformable flat element and there is exerted on a second surface of the deformable flat element, parallel and opposite the first surface, a constant pressure in the direction of the piece, so that the first surface of the deformable element closely follows the profile of the rough surface, penetrating between the peaks of this rough surface, wherein the deformable flat element is made of a material having a high degree of reversible elastic deformability so that the first surface of the element penetrates elastically and reversibly between the peaks of the rough surface, and the deformation (Poisson's contraction or dilatation) or the resultant displacement of the second surface of the deformable element is measured in situ, i.e. while the deformable flat element is being pressed against the rough surface. The invention also relates to an apparatus for carrying out this process.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.