Patent · US Expired

Device for controlling temperature charactristics of integrated circuits

US4952865A · kind A · utility

8Cited by
9References
3Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 20, 1989
Grant dateAug 28, 1990
Priority date
Expiry dateDec 20, 2009

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S323/907
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A circuit dedicated to the stabilization of integrated circuit temperature charactristics is achieved by integrating on the same semiconductor material chip as the integrated circuit and a device comprised of a sensor having at least two resistors (R1, R2 and/or R3, R4) supplied between two voltages (DC1, DC2) used alone or in conjunction with differential circuit structure (T2, T3) supplied by a current source (T1), comprising a transistorized variable load impedance (T4, T5, T6, T7). The resistors have different temperature coefficients, and the output voltage (VA or VB) of the bridge is temperature dependent. The integrated must incorporate a voltage-controlled element (transistor or diode).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.