Patent · US Expired

Dual purpose probe for simultaneous voltage and current sampling

US4952869A · kind A · utility

14Cited by
5References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 25, 1989
Grant dateAug 28, 1990
Priority date
Expiry dateSep 25, 2009

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/07
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A dual purpose probe for the simultaneous sampling of the voltage and curt at a test point. The device includes a capacitive probe for measuring voltage, and a small solenoid type inductor for measuring current when affixed so that it is at right angles to the wire being sampled. A small, double-sided circuit board has the inductor mounted thereon as well as a small metallic pick up plate which serves as one plate of a capacitor when the probe is affixed in the measuring position, while the conductor being sampled forms the other plate of the capacitor, and the insulation around the conductor serves as the capacitor dielectric.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.