Patent · US Expired

Manufacturing process for an electronic device

US4953277A · kind A · utility

16Cited by
2References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 7, 1989
Grant dateSep 4, 1990
Priority date
Expiry dateAug 7, 2009

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T29/49771
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A manufacturing process for an electronic device having a storage element, whereby, in various manufacturing stages, the device runs through testing stations. After passing through a testing station, information documenting the respective inspection step is stored in the storage element of the electronic device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.