Particle size analysis utilizing polarization intensity differential scattering
US4953978A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 3, 1989 |
| Grant date | Sep 4, 1990 |
| Priority date | — |
| Expiry date | Mar 3, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/4792
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Two arrangements are disclosed to provide high resolution measurement of sub-micrometer and micrometer particle size distributions. In a first arrangement, scattered light is measured over a wide range of scattering angles. At the same time, light scattered at low scattering angles is measured with high angular resolution. In the second arrangement an improved Polarization Intensity Differential Scattering (PIDS) measurement is made possible by providing an interrogating light beam of selected wavelength including a first component parallel to the scattering plane and a second component perpendicular to the scattering plane. Photodetecting arrangements detect light scattered by the particles at least at two scattering angles.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.