Patent · US Expired

Method for manufacturing a semiconductor component contactable on both sides

US4959328A · kind A · utility

2Cited by
0References
7Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 27, 1988
Grant dateSep 25, 1990
Priority date
Expiry dateMay 27, 2008

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/977
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method for manufacturing semiconductor components contactable on both sides, in particular IMPATT diodes. The active silicon layers of the IMPATT diode are grown onto a silicon substrate. The first silicon layer grown onto the silicon substrate has a high boron/germanium doping level and acts as an etch atop layer when the substrate is removed. The boron/germanium doping of the first silicon layer compensates for the mechanical stress in the silicon layer generated by the boron doping.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.