Patent · US Expired

Method for producing semiconductor integrated circuit device

US4962052A · kind A · utility

32Cited by
4References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 7, 1990
Grant dateOct 9, 1990
Priority date
Expiry dateFeb 7, 2010

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D84/401

Abstract

A method for producing a memory LSI having in its peripheral circuitry an MISFET of LDD structure and a vertical type bipolar transistor is disclosed. More particularly, an impurity for forming a low impurity concentration region of the said MISFET of LDD structure is introduced sideways of an emitter-base junction of the bipolar transistor. By the introduction of the said impurity, an effective impurity concentration near the base surface is reduced and the cut-off frequency of the bipolar transistor is improved.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.