Integrated circuit test socket
US4962356A · kind A · utility
28Cited by
11References
2Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 19, 1988 |
| Grant date | Oct 9, 1990 |
| Priority date | — |
| Expiry date | Aug 19, 2008 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/0433
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Improved performance and reliability is obtained in test sockets for integrated circuits (ICs). Sufficient over-travel is provided to prevent pinching when the IC and its carrier are inserted in the test socket and the lid is latched closed. A power operated piston applies controllable and uniform pressure to force the IC leads onto contact pins in the test socket base. This controllable and uniform pressure prevents gouged IC leads, bent test socket pins, and other damage that prevents proper electrical and mechanical contact between IC leads and contact pins resulting in erroneous indications of faulty IC operation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.