Pressure reduction device for particle sampling from compressed gases
US4962673A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 8, 1989 |
| Grant date | Oct 16, 1990 |
| Priority date | — |
| Expiry date | Mar 8, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2001/225
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Disclosed is a device for particle sampling from compressed gases. The device allows for anayzing particles from compressed gases of a pressure ranging from 20 psi to 3000 psi. In the device, the formula D.sub.s =D.sub.t .sqroot.(Q.sub.s /Q.sub.t) is applicable wherein D.sub.s and D.sub.t are the probe diameter and the chamber diameter, respectively, Q.sub.s is the sampling flow rate required by monitoring instruments, and Q.sub.t is the total flow rate determined by the orifice diameter and pressure whereby the sampling velocity substantially matches the local flow velocity at the probe. In addition, a distance between the orifice and the probe is greater than L wherein L=D.sub.c / (2 tan .alpha.) where D.sub.c is the chamber diameter and .alpha. is the half angle of jet expansion.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.