Patent · US Expired

Substrate structures for InP-based devices

US4963949A · kind A · utility

79Cited by
1References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 30, 1988
Grant dateOct 16, 1990
Priority date
Expiry dateSep 30, 2008

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S438/936
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A substrate structure for an InP-based semiconductor device having an InP based film is disclosed. The substrate structure includes a substrate region having a lightweight bulk substrate and an upper GaAs layer. An interconnecting region is disposed between the substrate region and the InP-based device. The interconnecting region includes a compositionally graded intermediate layer substantially lattice-matched at one end to the GaAs layer and substantially lattice-matched at the opposite end to the InP-based film. The interconnecting region further includes a dislocation mechanism disposed between the GaAs layer and the InP-based film in cooperation with the graded intermediate layer, the buffer mechanism blocking and inhibiting propagation of threading dislocations between the substrate region, and the InP-based device.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.