Patent · US Expired

Apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards

US4967148A · kind A · utility

29Cited by
11References
11Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 28, 1989
Grant dateOct 30, 1990
Priority date
Expiry dateAug 28, 2009

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/07371
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Apparatus for electrical function testing of wiring matrices, particularly of printed circuit boards. In the electrical function testing of wiring matrices, particularly of printed circuit boards, the number of required leads and switch elements can be drastically reduced. In the present apparatus, every measuring locations of the printed circuit board can be selected by an associated busbar and by an intermediate mask that prevents the contacting of non-selected measuring locations. The busbars preferably are orientated transversely relative to the principal direction of the wiring of the printed circuit board. The bus bar interconnecting a number of elements, each of the contact elements being a test probe.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.