Patent · US Expired

Drive device for an apparatus for electrical function testing of wiring matrices

US4967149A · kind A · utility

11Cited by

4References

9Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Guenter Doemens · Holzkirchen, DE
Thomas Rose · Worms, DE
Detlef Hoffmann · Burns Lake, CA
Arnold Heisen · Garching bei München, DE

Key dates

Filing date	Dec 19, 1988
Grant date	Oct 30, 1990
Priority date	—
Expiry date	Dec 19, 2008

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/304
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A drive device for an apparatus for electrical function testing of wiring matrices, which has optimally simple electrode shapes for the purpose of a further miniaturization with a two-electrode arrangement. For testing printed circuit boards a non-touching plasma contacting is used whereby two respectively selected measuring locations of a wiring matrix can be contacted via allocated discharge channels and their electrodes. The drive of the measuring locations (test points) occurs via control gas discharges that are generated by applying an adequately high voltage between the electrodes. By applying a voltage between the gas discharges, a current conduction that can be evaluated for test purposes is generated for a conductive connection between the test points.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.