Patent · US Expired

Method and apparatus for rapid analysis of a sample medium

US4968632A · kind A · utility

17Cited by
9References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 18, 1989
Grant dateNov 6, 1990
Priority date
Expiry dateSep 18, 2009

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T436/207497
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus for rapid analysis of a sample medium, particularly a flowing sample medium employ light of a defined wavelength which is guided onto a luminescent layer in contact with the sample medium, the luminescent properties of the layer varying in dependence upon characteristics of the sample medium which are to be analyzed. The luminescent light is monitored by detectors, the detector signals being a measure for the characteristic of interest. For undertaking identification of a particular characteristic with very short follow-up time, even in the presence of a number of other characteristics which influence the luminescent properties, the luminescent intensity is identified for a number of different wavelength regions corresponding in number to the number of characteristics, each characteristic differently influencing the luminescent properties in at least one wavelength region. The signals thus obtained are supplied to a processing device for identifying the value of the characteristic of interest.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.