Measurement of solid particle concentration in presence of a second particle type
US4969741A · kind A · utility
13Cited by
3References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 21, 1989 |
| Grant date | Nov 13, 1990 |
| Priority date | — |
| Expiry date | Jul 21, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0833
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
This invention pertains to a method and an apparatus for determining concentration of solid particles of interest in a sample in the presence of at least one other type of solid particle by measuring light scatter at a wavelength which is independent of solid particle concentration which is not of interest and related to solid particle concentration of interest. Preferably, solid particles of interest are cells grown in cell culture medium comprising a solid substrate.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.