Scanning laser microscope system and methods of use
US4972258A · kind A · utility
77Cited by
15References
105Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 31, 1989 |
| Grant date | Nov 20, 1990 |
| Priority date | — |
| Expiry date | Jul 31, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG02B21/002
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
A scanning laser microscope system for assisting in the detection and characterization of fine details and structures of materials or other samples. The system can have means for enhancing light from the material to assist detection of anomalies, such as inclusions in the material and crystal lattice dislocations. The system can have means for enhancing fluorescent light emitted from the sample. The system can further have very precise means for processing signals representative of light detected from the material.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.