Three-dimensional displacement gage
US4972597A · kind A · utility
Assignees
Inventors
Key dates
| Filing date | Dec 14, 1989 |
| Grant date | Nov 27, 1990 |
| Priority date | — |
| Expiry date | Dec 14, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/007
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A three-dimensional displacement gauge comprising a housing, a probe rotatably and slidably mounted on the housing, the probe is slidable along a first direction and having a contact member attached at one end thereof, two emitting members mounted on the probe each for emitting a light beam, two-dimensional measuring member such as a position sensor fixed to the housing for detecting the light beams, a biasing spring for biasing the probe toward the contact member, and a limit switch attached to the housing for detecting whether or not the probe moves in the first direction. The two-dimensional measuring member detects the light beams struck thereon so as to measure a small displacement of the contact member of the probe either in the first direction or in a second direction perpendicular to the first direction. In another mode, the two emitting members are mounted on the housing, and a mirror is mounted at the other end of the probe, and the two-dimensional measuring element detect the light beams struck thereon from the emitting members by way of the mirror.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.