Lens system for a photo ion spectrometer
US4973842A · kind A · utility
8Cited by
8References
3Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 4, 1987 |
| Grant date | Nov 27, 1990 |
| Priority date | — |
| Expiry date | May 4, 2007 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/282
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A lens system in a photo ion spectrometer for manipulating a primary ion beam and ionized atomic component. The atomic components are removed from a sample by a primary ion beam using the lens system, and the ions are extracted for analysis. The lens system further includes ionization resistant coatings for protecting the lens system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.