Patent · US Expired

Process enhancement using molybdenum plugs in fabricating integrated circuits

US4975386A · kind A · utility

20Cited by
9References
11Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 22, 1989
Grant dateDec 4, 1990
Priority date
Expiry dateDec 22, 2009

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/136
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of interconnecting circuit components in a semiconductor integrated circuit including component elements formed in the substrate and thin-film resistors and capacitors formed on a surface of the substrate, a molybdenum plug is utilized to facilitate stable, uniform low resistance contacts to circuit elements, molybdenum (moly) plugs are utilized as a barrier between interconnect metallization and the circuit components. A CLAD moly/aluminum metallization interconnect can be fabricated in a standard process in which the moly plugs are formed. The accuracy and stability of thin-film resistors is facilitated during wafer processing, laser trimming, temperature cycling, and assembly processing thereby providing repeatable matching by eliminating contact resistance as a process variable.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.