Patent · US Expired

Method and instrument for mass analyzing samples with a quistor

US4975577A · kind A · utility

31Cited by
5References
8Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 29, 1989
Grant dateDec 4, 1990
Priority date
Expiry dateDec 29, 2009

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J49/429
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method for the measurement of mass spectra by three dimensional quadrup fields (QUISTORs) is presented, in which the ions are mass-to-charge selectively ejected by a selected nonlinear resonance effect in an inharmonic QUISTOR. In order to enhance scan speed and mass resolution, the ejection of a single kind of ions can be confined to a very small time interval, either by the generation of ions within a small volume outside the field center, or by an excitation of the secular amplitudes by an additional RF voltage across the end electrodes, shortly before the ions encounter the sum resonance condition. An instrument for this method is described.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.