Method and instrument for mass analyzing samples with a quistor
US4975577A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 29, 1989 |
| Grant date | Dec 4, 1990 |
| Priority date | — |
| Expiry date | Dec 29, 2009 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/429
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method for the measurement of mass spectra by three dimensional quadrup fields (QUISTORs) is presented, in which the ions are mass-to-charge selectively ejected by a selected nonlinear resonance effect in an inharmonic QUISTOR. In order to enhance scan speed and mass resolution, the ejection of a single kind of ions can be confined to a very small time interval, either by the generation of ions within a small volume outside the field center, or by an excitation of the secular amplitudes by an additional RF voltage across the end electrodes, shortly before the ions encounter the sum resonance condition. An instrument for this method is described.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.