Method and device for measuring the elasticity of a superficial layer, in particular of the skin
US4976272A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 31, 1989 |
| Grant date | Dec 11, 1990 |
| Priority date | — |
| Expiry date | Mar 31, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/0089
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The method for measuring the elasticity of a superficial layer (2), in particular of the skin, comprises defining a zone (7) of this layer; creating a negative pressure in this zone to cause a deformation of the zone; and measuring the negative pressure necessary to cause a deformation of predetermined amplitude. The measuring device includes a sensor (3) provided with a cavity (5) defined by a rim (6) arranged to be pressed against the layer (2) to be studied, and a pump (17) for creating a negative pressure in the cavity (5). A suction opening (20) is provided in the cavity at a predetermined distance (d) from the superficial layer, in such a manner as to be obturated by the layer when the deformation attains the predetermined amplitude. A pick-up device is provided for measuring the negative pressure that has produced the deformation of predetermined amplitude.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.