Patent · US Expired

Free response test grading method

US4978305A · kind A · utility

93Cited by
11References
20Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 6, 1989
Grant dateDec 18, 1990
Priority date
Expiry dateJun 6, 2009

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG09B7/00
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A method and system for grading free response tests including the use of highly accurate machine-readable data codes to uniquely associate test-taker, test and reader/grader, and a portable sensing device which stores codes read by the device for subsequent entry into a host computer. The method permits multiple readers/graders to evaluate the same test without one reader/grader influencing another, while reducing paper handling and key entry of data inherent in large volume paper and pencil testing techniques.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.