Foucault knife-edge test for quantitatively determining a wavefront aberration over the entire surface of an optical imaging device
US4979819A · kind A · utility
3Cited by
1References
3Claims
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Key dates
| Filing date | Mar 28, 1990 |
| Grant date | Dec 25, 1990 |
| Priority date | — |
| Expiry date | Mar 28, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01M11/0257
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The historical Foucault knife-edge test enables one to qualitatively ascertain an optical imaging device's characteristics, for example, whether or not it is a source of optical aberrations. The novel method of the present invention, in sharp contrast, complements the historical Foucault knife-edge test, by expanding the test so as to develop a quantitative interpretation of the imaging device's characteristics. In particular, the novel method is suitable for determining a wavefront aberration over an entire surface of the imaging device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.