Patent · US Expired

Method of manufacturing a lateral transistor

US4985367A · kind A · utility

2Cited by
8References
18Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 11, 1989
Grant dateJan 15, 1991
Priority date
Expiry dateJul 11, 2009

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S148/01
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of manufacturing a lateral transistor which comprises the steps of forming N type semiconductor silicon layer on P type semiconductor substrate, depositing base region on part of the semiconductor silicon layer, forming field oxide layer bearing an opening on the base region, forming thin insulation layer on that part of the semiconductor body which is exposed by the opening, forming an annular pattern on the thin insulation layer, implanting a P type impurity in the base region, thereby providing an emitter region and collector region in the self-aligned fashion with respect to the annular pattern, retaining the annular pattern, and depositing insulation layer on the resultant structure, boring an emitter contact hole having a smaller diameter than the outer diameter of the annular pattern, and forming emitter contact hole in the self-aligned fashion with respect to the annular pattern, and forming emitter electrode in contact with the emitter region through the contact hole.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.