Patent · US Expired

Inspection apparatus incorporating digital electron detection

US4985628A · kind A · utility

2Cited by
9References
15Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 29, 1988
Grant dateJan 15, 1991
Priority date
Expiry dateNov 29, 2008

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/305
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An inspection apparatus which incorporates a digital electron detection device. In this apparatus, counting devices are used for the measurement of electrons emanating from an object after interaction with an incident radiation beam. Using these counters, detection is also possible even when the electron pulses have a small current content. By the addition of a DAC and possibly a sample-and-hold circuit, spectometric measurements are possible so that absolute potential values of a measuring point can be determined. For measurement of comparatively large currents, digital feedback can be used. Multi-sampling make possible much faster measurements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.