Patent · US Expired

Socket for tab burn-in and test

US4986760A · kind A · utility

15Cited by
9References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 19, 1989
Grant dateJan 22, 1991
Priority date
Expiry dateMay 19, 2009

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R1/0475
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Test and burn-in sockets with many mechanical contacts require increased support strength, and with the increase in the number of contacts it is beneficial that the contacts are inserted before assembly, the contacts in the support comb are supported to restrict movement of the contact other than in the path of movement of the IC device, and the registration and movement of the IC device is sufficient to obtain good electrical contact and maintain electrical contact during temperature cycling.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.