Method of inspecting objects by image pickup means
US4989083A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 23, 1990 |
| Grant date | Jan 29, 1991 |
| Priority date | — |
| Expiry date | Jan 23, 2010 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/024
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An inspection method utilizing computer graphics in inspecting a certain part of an object which is being imaged by an image pickup apparatus such as an electronic scope. A computer-graphics picture simulating th eobject picture obtained by the image pickup apparatus is drawn by means of a computer-graphics apparatus. The parameters used for the drawing are varied so as to approximate or equalize the computer-graphics picture to or with the object picture, thereby making it possible for any flaw or the like on the object to be detected with ease by comparing the two picture with each other even if the object has a complicated configuration. Furthermore, that portion of the computer-graphics picture which corresponds to the inspected part of the object picture is specified, and, by using information on the portion thus specified, inspections on the inspected part, such as measurement of length and examination for discoloration, can be performed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.