Mass analysis apparatus and method
US4990856A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 3, 1989 |
| Grant date | Feb 5, 1991 |
| Priority date | — |
| Expiry date | Oct 3, 2009 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/38
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A small sample of material is introduced into a vacuum to be analyzed, by ionization of atoms or molecular fragments of the sample using an electron or photon beam. The ionized species are trapped in a structure that defines electric fields or a combination of electric and magnetic fields in such a way that their motions are confined to the interior of the trap and that their motions within the trap are characterized by unique and discrete frequencies of oscillation dependent on the mass-to-charge ratio of the individual species. In order to provide for the detection of the frequencies of the motions, additional electrical signals are applied to the trapping structure so as to cause the motions to take place with a considerable degree of coherence. Alternatively, the coherence may be caused by creation of the ions during a very short pulse of the electron or photon beam at a position within the trapping structure but displaced from a positon of equilibrium. An electrical response to the individual motions of the ions, taking place at discrete frequencies related to their mass-to-charge ratios, frequency analyzed to determine the mass-to-charge ratios of the ions contribute to that …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.