Patent · US Expired

Apparatus for measuring temperature using a sensor element

US4997286A · kind A · utility

17Cited by
4References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 4, 1989
Grant dateMar 5, 1991
Priority date
Expiry dateMay 4, 2009

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG02B6/262
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus for measuring temperature in a region of high temperature is disclosed herein. The measuring apparatus includes a sensor made from a fluorescent material, located within the region of high temperature. The fluorescent decay time of the fluorescent material is dependent upon the temperature of the fluorescent material. A first optical waveguide is located within the high temperature region and coupled to the sensor by means of a glass solder. The first optical waveguide is coupled to a second optical waveguide located outside the region of high temperature, and the second optical waveguide is connected to a means for detecting and evaluating the fluorescent radiation, also located outside the region of high temperature. A source of excitation radiation is used to cause the fluorescent material to fluoresce, and by measuring the fluorescence decay time, the temperature within the region can be determined.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.