Topography measuring apparatus
US4998819A · kind A · utility
29Cited by
47References
36Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 4, 1989 |
| Grant date | Mar 12, 1991 |
| Priority date | — |
| Expiry date | May 4, 2009 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/255
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A contour measuring apparatus and method of using the same is disclosed to measure the three-dimensional contour of a surface. Structure is provided to direct first light beams onto the surface being measured. Reflections of the first light beams from the surface are received for generating electrical output signals corresponding to electro-optically measurable optical images. The output signals are electrically processed to determine the radius of curvature of the surface being measured. A higher spatial resolution can be achieved without changing the spacing of the array of light points.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.