Patent · US Expired

Angle measuring arrangement

US5001340A · kind A · utility

5Cited by

4References

14Claims

0Family size

Assignee

DR. JOHANNES HEIDENHAIN GMBH · DE

Inventors

Ernst Schwefel · Traunreut, DE
Dieter Michel · Traunstein, DE
Olivier Pariaux · Lausanne, CH

Key dates

Filing date	Oct 24, 1989
Grant date	Mar 19, 1991
Priority date	—
Expiry date	Oct 24, 2009

Classification

Technology area (CPC G)Physics
CPC primaryG01D5/38
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An interferometric type photoelectric measuring device is disclosed. The photoelectric angle measuring device includes a graduation carrier having a circular graduation and a scanning arrangement for the diametral scanning of the circular graduation. The scanning arrangement is constructed as an integrated optical circuit.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.